Browsing by Author "Egitto, F."

Now showing items 1-4 of 4

    • Adhesion of copper to poly(tetrafluoroethylene) surfaces modified with vacuum UV radiation from helium arc plasma 

      Zheng, S.; Entenberg, Alan; Takacs, Gerald; Egitto, F.; Matienzo, L. (Springer-Verlag: Journal of Adhesion Science and Technology, 2003-12)
      Poly(tetrafluoroethylene) (PTFE) film surfaces were exposed to vacuum UV (VUV) radiation from He dc arc plasmas that were made to rotate inside a graphite tube by the application of an auxiliary magnetic field. The films ...

    • Photoetching and modification of organic polymer surfaces with vacuum UV radiation 

      Takacs, Gerald; Vukanovic, V.; Tracy, D.; Chen, J.; Egitto, F.; Matienzo, L.; Emmi, F. (Elsevier: Polymer Degradation and Stability, 1993)
      Commercially available organic polymer films were treated with radiation from 6·7 × 104 Pa He and Ar plasmas that were made to rotate inside a graphite tube by the application of an auxiliary magnetic field. To investigate ...

    • Photoetching and modification of poly(tetrafluoroethylene-co-hexafluoropropylene) polymer surfaces with vacuum UV radiation 

      Chen, J.; Tracy, D.; Zheng, S.; Xiaolu, L.; Brown, Scott; VanDerveer, William; Entenberg, Alan; Vukanovic, V.; Takacs, Gerald; Egitto, F.; Matienzo, L.; Emmi, F. (Elsevier: Polymer Degradation and Stability, 2003-03)
      Films of poly(tetrafluoroethylene-co-hexafluoropropylene) (FEP) were exposed to radiation from 6.7 x 104 Pa He and Ar dc arc plasmas that were made to rotate inside of a graphite tube by the application of an auxiliary ...

    • Surface composition and distribution of fluorine in plasma-fluorinated polyimide 

      Matienzo, L.; Emmi, F.; Egitto, F.; Van Hart, D.; Vukanovic, V.; Takacs, Gerald (The American Vacuum Society: Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films, 1988-05)
      Surface composition, fluorine distribution, and morphology were determined for polyimide films modified downstream from microwave plasmas containing CF4/O2. Complementary analytical techniques including x-ray photoelectron ...