Browsing by Author "Ninkov, Zoran"

Now showing items 1-8 of 8

    • Characterization of a large-format charge-coupled device 

      Deeg, Hans; Ninkov, Zoran (International Society for Optical Engineering (SPIE), 1995-01)
      Characterization of a Kodak KAF 4200 CCD chip, coated with the UV converter Lumigen, is described. This chip is very similar to a chip described by Ninkov, Backer, and Bretz [Proc. SPIE 1987, 14 (1 993)], except for the ...

    • Focal plane detector array developments 

      Ninkov, Zoran; Forrest, William (International Society for Optical Engineering (SPIE), 2002-06)
      n/a

    • Influence of nonuniform charge-coupled device pixel response on aperture photometry 

      Kavaldjiev, Daniel; Ninkov, Zoran (The International Society for Optical Engineering (SPIE), 2001-02)
      The extensive use of charge-coupled devices (CCDs) in astronomical imaging and spectroscopic applications has resulted in techniques being developed to correct for sensitivity variations attributable to the focal plane ...

    • A Near stellar occultation by P/Grigg-Skjellerup 

      Ninkov, Zoran (International Society for Optical Engineering (SPIE), 1994-03)
      P/Grigg-Skjellerup was observed to pass within 200 km of the line of sight to an anonymous faint star on the 1992 July 8 UT. The star's brightness was attenuated by 35% at closest approach by the comet. This result, combined ...

    • Quantum efficiency overestimation and deterministic cross talk resulting from interpixel capacitance 

      Moore, Andrew; Ninkov, Zoran; Forrest, William (International Society for Optical Engineering (SPIE), 2006-07)
      Pixels in both hybridized and monolithic complementary metal-oxide semiconductor (CMOS) detector arrays may couple capacitively to their neighboring pixels. This “interpixel capacitance” can signifi- cantly distort the ...

    • RIT Research Programs 2006 Annual Report 

      Boyd, Donald; Schott, John; Hirschman, Karl; Ogut, Ali; Kerekes, John; Ninkov, Zoran; O'Dea, Christopher; Cao, Xiaojun; Ferran, Maureen; Marschark, Marc; Thurston, Michael; Chung, Robert; Pope, Bill (Rochester Institute of Technology, 2006-08)

    • Subpixel sensitivity map for a charge-coupled device sensor 

      Kavaldjiev, Daniel; Ninkov, Zoran (International Society for Optical Engineering (SPIE), 1998-03)
      The sensitivity across a solid state detector array varies as a result of differences in transmission, diffusion and scattering properties over the sensor. This variation will occur over a range of scale lengths and its ...

    • Subpixel sensitivity maps for a back-illuminated charge-coupled device and the effects of nonuniform response on measurement accuracy 

      Piterman, Albert; Ninkov, Zoran (International Society for Optical Engineering (SPIE), 2002-06)
      A measurement program designed to investigate the variations in sensitivity of focal plane arrays on a subpixel scale has produced such information for a front-illuminated CCD device, results for which have been previously ...