Browsing by Subject "Ellipsometry"
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Spectrophotopolarimeter based on multiple reflections in a coated dielectric slab
(Elsevier - Thin solid films, 1998-02)A division-of-amplitude photopolarimeter is described that uses multiple reflections inside a coated dielectric slab at oblique incidence. The first four parallel reflected beams pass through suitably oriented, but fixed, ...