dc.contributor.advisor | Granger, Edward | |
dc.contributor.author | Huff, Kevin | |
dc.date.accessioned | 2009-07-10T17:20:44Z | |
dc.date.available | 2009-07-10T17:20:44Z | |
dc.date.issued | 1987-08-12 | |
dc.identifier.uri | http://hdl.handle.net/1850/10135 | |
dc.description.abstract | A study was conducted to compare the mid-frequency line edge noise
algorithms of Jim Hamerly and Yigal Gur. Comparisons were made to
determine which algorithm correlated best with the psychophysical defect
known as raggedness. Tests were conducted on
"standard"
observers
using a series of test images with varying amounts of edge noise. A
master image was produced photographically and ensuing images generated
with random error using electrophotographic processes. Scanning of the
images to determine output metric values was done on a Zeiss microdensitometer.
It was found that with electrophotographic prints, the Hamerly
algorithm has a correlation coefficient of .83. Determination of
metric values for the Gur algorithm were not possible due to an error
in scanning procedure. A subjective evaluation of his algorithm is
included in its place. | en_US |
dc.language.iso | en_US | en_US |
dc.relation | RIT Scholars content from RIT Digital Media Library has moved from http://ritdml.rit.edu/handle/1850/10135 to RIT Scholar Works http://scholarworks.rit.edu/theses/4223, please update your feeds & links! | |
dc.subject | Photographic images | en_US |
dc.subject | Image quality | en_US |
dc.subject | Algorithms | en_US |
dc.subject.lcc | TR222.H83 1987 | |
dc.subject.lcsh | Images, Photographic | en_US |
dc.subject.lcsh | Algorithms | en_US |
dc.subject.lcsh | Fourier transform optics | en_US |
dc.subject.lcsh | Electrophotography | en_US |
dc.title | Comparison of the mid-frequency line edge noise algorithms of Jim Hamerly and Yigal Gur for the best correlation to the psychophysical defect known as raggedness | en_US |
dc.type | Thesis | en_US |
dc.description.college | College for Imaging Arts and Sciences | en_US |
dc.description.school | School of Design | en_US |