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Perseverance is key, NTID's Hurwitz tells deaf grads

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dc.contributor.author NTID
dc.date.accessioned 2009-07-30T22:43:14Z
dc.date.available 2009-07-30T22:43:14Z
dc.date.issued 2004-06-18
dc.identifier.uri http://hdl.handle.net/1850/10374
dc.description.abstract Dr. T. Alan Hurwitz, vice president for Rochester Institute of Technology and dean of the National Technical Institute for the Deaf, told deaf high school graduates that higher education and perseverance are critical to success. en_US
dc.language.iso en_US en_US
dc.publisher Rochester Institute of Technology en_US
dc.title Perseverance is key, NTID's Hurwitz tells deaf grads en_US
dc.type Article en_US


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