Browsing Citations Only by Author "Ninkov, Zoran"
Now showing items 1-7 of 7
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Characterization of a large-format charge-coupled device
Deeg, Hans; Ninkov, Zoran (International Society for Optical Engineering (SPIE), 1995-01)Characterization of a Kodak KAF 4200 CCD chip, coated with the UV converter Lumigen, is described. This chip is very similar to a chip described by Ninkov, Backer, and Bretz [Proc. SPIE 1987, 14 (1 993)], except for the ... -
Focal plane detector array developments
Ninkov, Zoran; Forrest, William (International Society for Optical Engineering (SPIE), 2002-06)n/a -
Influence of nonuniform charge-coupled device pixel response on aperture photometry
Kavaldjiev, Daniel; Ninkov, Zoran (The International Society for Optical Engineering (SPIE), 2001-02)The extensive use of charge-coupled devices (CCDs) in astronomical imaging and spectroscopic applications has resulted in techniques being developed to correct for sensitivity variations attributable to the focal plane ... -
A Near stellar occultation by P/Grigg-Skjellerup
Ninkov, Zoran (International Society for Optical Engineering (SPIE), 1994-03)P/Grigg-Skjellerup was observed to pass within 200 km of the line of sight to an anonymous faint star on the 1992 July 8 UT. The star's brightness was attenuated by 35% at closest approach by the comet. This result, combined ... -
Quantum efficiency overestimation and deterministic cross talk resulting from interpixel capacitance
Moore, Andrew; Ninkov, Zoran; Forrest, William (International Society for Optical Engineering (SPIE), 2006-07)Pixels in both hybridized and monolithic complementary metal-oxide semiconductor (CMOS) detector arrays may couple capacitively to their neighboring pixels. This “interpixel capacitance” can signifi- cantly distort the ... -
Subpixel sensitivity map for a charge-coupled device sensor
Kavaldjiev, Daniel; Ninkov, Zoran (International Society for Optical Engineering (SPIE), 1998-03)The sensitivity across a solid state detector array varies as a result of differences in transmission, diffusion and scattering properties over the sensor. This variation will occur over a range of scale lengths and its ... -
Subpixel sensitivity maps for a back-illuminated charge-coupled device and the effects of nonuniform response on measurement accuracy
Piterman, Albert; Ninkov, Zoran (International Society for Optical Engineering (SPIE), 2002-06)A measurement program designed to investigate the variations in sensitivity of focal plane arrays on a subpixel scale has produced such information for a front-illuminated CCD device, results for which have been previously ...