Browsing Citations Only by Subject "Astrometry"
Now showing items 1-1 of 1
-
Subpixel sensitivity maps for a back-illuminated charge-coupled device and the effects of nonuniform response on measurement accuracy
(International Society for Optical Engineering (SPIE), 2002-06)A measurement program designed to investigate the variations in sensitivity of focal plane arrays on a subpixel scale has produced such information for a front-illuminated CCD device, results for which have been previously ...