| dc.contributor.author | Moore, Andrew | en_US |
| dc.contributor.author | Ninkov, Zoran | en_US |
| dc.contributor.author | Forrest, William | en_US |
| dc.date.accessioned | 2006-12-18T16:56:27Z | en_US |
| dc.date.available | 2006-12-18T16:56:27Z | en_US |
| dc.date.issued | 2006-07 | en_US |
| dc.identifier.citation | Optical Engineering 45N7 (2006) 076402-1-9 | en_US |
| dc.identifier.issn | 0091-3286 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1850/3044 | en_US |
| dc.description | RIT community members may access full-text via RIT Libraries licensed databases: http://library.rit.edu/databases/ | |
| dc.description.abstract | Pixels in both hybridized and monolithic complementary
metal-oxide semiconductor (CMOS) detector arrays may couple capacitively
to their neighboring pixels. This “interpixel capacitance” can signifi-
cantly distort the characterization of conversion efficiency and modulation
transfer function (MTF) in MOS devices. These effects have been
largely unaccounted for in measurements to date. In this work, the effects
of this coupling are investigated. Compensation methods for these
errors are described and applied to silicon P-I-N array measurements.
The measurement of Poisson noise, traditionally done by finding the
mean square difference in a pair of images, needs to be modified to
include the mean square correlation of differences with neighboring
pixels. | en_US |
| dc.description.sponsorship | We would like to thank NASA for supporting this work through various NASA grants supporting the P-I-N array research, and acknowledge NYSTAR and the New York State Center for Advanced Technology(Center for Electronic Imaging Systems) for additional support. The University of Rochester NIR laboratory provided the InSb data. Gert Finger (ESO) and Don Figer (STScI) aided critique that was greatly appreciated while they prepared for the
2005 Scientific Detector Workshop in Italy. | en_US |
| dc.format.extent | 271351 bytes | en_US |
| dc.format.mimetype | application/pdf | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | International Society for Optical Engineering (SPIE) | en_US |
| dc.relation.ispartofseries | vol. 45 | en_US |
| dc.relation.ispartofseries | no. 7 | en_US |
| dc.subject | Complementary metal oxide semiconductors | en_US |
| dc.subject | Cross talk | en_US |
| dc.subject | Detector array | en_US |
| dc.subject | Interpixel capacitance | en_US |
| dc.subject | Modulation transfer function | en_US |
| dc.subject | Quantum efficiency | en_US |
| dc.title | Quantum efficiency overestimation and deterministic cross talk resulting from interpixel capacitance | en_US |
| dc.type | Article | en_US |
| dc.identifier.url | http://dx.doi.org/10.1117/1.2219103 | |
