| dc.contributor.author | Kavaldjiev, Daniel | en_US |
| dc.contributor.author | Ninkov, Zoran | en_US |
| dc.date.accessioned | 2006-12-18T16:56:40Z | en_US |
| dc.date.available | 2006-12-18T16:56:40Z | en_US |
| dc.date.issued | 1998-03 | en_US |
| dc.identifier.citation | Optical Engineering 37N3 (1998) 948-954 | en_US |
| dc.identifier.issn | 0091-3286 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1850/3045 | en_US |
| dc.description | RIT community members may access full-text via RIT Libraries licensed databases: http://library.rit.edu/databases/ | |
| dc.description.abstract | The sensitivity across a solid state detector array varies as a
result of differences in transmission, diffusion and scattering properties
over the sensor. This variation will occur over a range of scale lengths
and its knowledge is of importance for improved device design and in a
variety of applications, for example, event centroiding in photon counting
systems. A measurement of the sensitivity variation on a subpixel scale
for a two-phase front-illuminated CCD is reported. The measurement is
made using a scanning reflection microscope. A variation in sensitivity
between the phases within a pixel is clearly observed, as well as variations
on a much smaller spatial scale. | en_US |
| dc.description.sponsorship | This work was supported in part by funding from the National
Science Foundation, the S/IUCRC program, and the
New York State CAT program. We would like to acknowledge
the help of our colleagues, namely Mehdi Vaez-
Iravani, now of KLA-Tencor, Gerry Lubberts of the Rochester
Institute of Technology and Bruce Burkey at Eastman
Kodak. | en_US |
| dc.format.extent | 1494509 bytes | en_US |
| dc.format.mimetype | application/pdf | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | International Society for Optical Engineering (SPIE) | en_US |
| dc.relation.ispartofseries | vol. 37 | en_US |
| dc.relation.ispartofseries | no. 3 | en_US |
| dc.subject | Charge-coupled device | en_US |
| dc.subject | Crosstalk | en_US |
| dc.subject | Pixel sensitivity | en_US |
| dc.subject | Response function | en_US |
| dc.title | Subpixel sensitivity map for a charge-coupled device sensor | en_US |
| dc.type | Article | en_US |
| dc.identifier.url | http://dx.doi.org/10.1117/1.601788 | |
