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dc.contributor.authorHailstone, Richarden_US
dc.date.accessioned2006-12-18T17:46:56Zen_US
dc.date.available2006-12-18T17:46:56Zen_US
dc.date.issued1999-08-01en_US
dc.identifier.citationJournal of Applied Physics 86N3 (1999) 1363-1369en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://hdl.handle.net/1850/3125en_US
dc.description.abstractComputer simulation is used to study the effect of iodide impurity on silver cluster formation on AgBr microcrystals. The simulation is based on a nucleation-and-growth model of silver cluster formation in competition with recombination of electrons and holes. The efficiency of silver cluster formation is calculated as a function of microcrystal size and shown to increase with size for the impurity-free control, contrary to experimental data. This behavior is due to a partitioning of the hole between free and trapped states which favors the free side as size increases. As a result, recombination decreases and efficiency increases at large microcrystal size. Iodide impurity decreases efficiency relatively more at larger sizes because it introduces an internal recombination pathway not present in the control simulation. Because of their larger volume-to-surface-area ratios, the larger microcrystals are affected more by this additional recombination pathway than smaller microcrystals.en_US
dc.format.extent68438 bytesen_US
dc.format.mimetypeapplication/pdfen_US
dc.language.isoen_USen_US
dc.publisherAmerican Institute of Physicsen_US
dc.relation.ispartofseriesvol. 86en_US
dc.relation.ispartofseriesno. 3en_US
dc.subjectDigital simulationen_US
dc.subjectElectron-hole recombinationen_US
dc.subjectImpuritiesen_US
dc.subjectMetal clustersen_US
dc.subjectNucleationen_US
dc.subjectPhotographic material sensitivityen_US
dc.subjectSilveren_US
dc.subjectSilver compoundsen_US
dc.subjectSurface compositionen_US
dc.subjectSurface recombinationen_US
dc.titleEffect of I– impurity on the efficiency of silver cluster formation on AgBr microcrystal surfacesen_US
dc.typeArticleen_US
dc.identifier.urlhttp://dx.doi.org/10.1063/1.370895


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