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dc.contributor.authorBlodgett, Jerryen_US
dc.contributor.authorEaston, Rogeren_US
dc.date.accessioned2006-12-18T18:06:59Zen_US
dc.date.available2006-12-18T18:06:59Zen_US
dc.date.issued1981-03en_US
dc.identifier.citationApplied Optics 20N6 (1981) 1050-1055en_US
dc.identifier.issn0003-6935en_US
dc.identifier.urihttp://hdl.handle.net/1850/3162en_US
dc.description.abstractThe use of optical power spectrum analysis for feature detection and classification is often restricted by the superposition of the aperture spectrum. A spatial frequency filtering technique using a circular aperture and filters has been previously proposed to separate the object and aperture spectra. An adaptation of this technique using square apertures and an opaque cross spatial filter offers improved performance for some applications. Numerical calculations and experimental results are given comparing the two techniques.en_US
dc.format.extent69352 bytesen_US
dc.format.mimetypeapplication/pdfen_US
dc.language.isoen_USen_US
dc.publisherOptical Society of Americaen_US
dc.relation.ispartofseriesvol. 20en_US
dc.relation.ispartofseriesno. 6en_US
dc.subjectAperturesen_US
dc.subjectClassificationsen_US
dc.subjectDiffraction patternsen_US
dc.subjectFourier transformationen_US
dc.subjectImage processingen_US
dc.subjectOptical filtersen_US
dc.subjectPattern recognitionen_US
dc.subjectPower spectraen_US
dc.subjectSpatial filteringen_US
dc.subjectSpectrum analysisen_US
dc.titleTwo-stage spatial-filtering for diffraction pattern-analysisen_US
dc.typeArticleen_US
dc.identifier.urlhttp://dx.doi.org/10.1364/AO.20.001050


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