dc.contributor.author | Feng, Xiaofan | en_US |
dc.contributor.author | Schott, John | en_US |
dc.contributor.author | Gallagher, Timothy | en_US |
dc.date.accessioned | 2007-07-05T14:08:56Z | en_US |
dc.date.available | 2007-07-05T14:08:56Z | en_US |
dc.date.issued | 1993-03 | en_US |
dc.identifier.citation | Applied Optics 32N7 (1993) 1234-1242 | en_US |
dc.identifier.issn | 0003-6935 | en_US |
dc.identifier.uri | http://hdl.handle.net/1850/4234 | en_US |
dc.description | RIT community members may access full-text via RIT Libraries licensed databases: http://library.rit.edu/databases/ | |
dc.description.abstract | Currently, spectrophotometric standard reference materials are calibrated only by using the illumination
and viewing geometries recommended by the Commission Internationale de l'Eclairage, and for some
geometries the spectral range is limited to the visible wavelengths. A need exists for procedures that
calibrate standards at many other geometries and for a broader spectral range. Two methods for
calibrating the spectral bidirectional reflectance factor are described. The absolute bidirectional
reflectance factor of a sintered polytetrafluoroethylene (PTFE) sample is determined for nearly all the
possible illumination and viewing geometries from 400 nm to 2500 nm. The references are a 45/0
reflectance standard calibrated by the National Institute of Standards and Technology and a sintered
PTFE sample with a directional, hemispherical reflectance factor traceable to the Institute. The results
of the two methods agree to within 0.01 in reflectance factor values. With this PTFE sample as a
transfer standard, the instrument described can also be used to measure the absolute bidirectional
reflectance factor at nearly all the illumination and viewing geometries from 400 nm to 2500 nm. | en_US |
dc.description.sponsorship | n/a | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | Optical Society of America (OSA) | en_US |
dc.relation.ispartofseries | vol. 32 | en_US |
dc.relation.ispartofseries | no. 7 | en_US |
dc.subject | Radiometry | en_US |
dc.subject | Reflectance | en_US |
dc.subject | Scattering | en_US |
dc.subject | Spectroradiometers | en_US |
dc.title | Comparison of methods for generation of absolute reflectance factor values for bidirectional reflectance-distribution function studies | en_US |
dc.type | Article | en_US |
dc.identifier.url | http://dx.doi.org/10.1364/AO.32.001234 | |