| dc.contributor.author | Nizette, Michel | en_US |
| dc.contributor.author | Erneux, Thomas | en_US |
| dc.contributor.author | Gavrielides, Athanasios | en_US |
| dc.contributor.author | Kovanis, Vassilios | en_US |
| dc.contributor.author | Simpson, Thomas | en_US |
| dc.date.accessioned | 2007-09-13T01:48:50Z | en_US |
| dc.date.available | 2007-09-13T01:48:50Z | en_US |
| dc.date.issued | 2002-05 | en_US |
| dc.identifier.citation | Physical Review E 65N5 (2002) 056610 | en_US |
| dc.identifier.issn | 1539-3755 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1850/4675 | en_US |
| dc.description.abstract | Rate equations for semiconductor lasers subjected to simultaneous near-resonant optical injection and microwave current modulation are examined by combined analytical-numerical bifurcation techniques. Simple qualitative criteria are given for a bistable response. These results compare well with experimental measurements. | en_US |
| dc.description.sponsorship | The research of A.G. and V.K. was supported by the U.S. Air Force Office of Scientific Research. The research of T.E. was supported by the U.S. Air Force Office of Scientific Research through Grant No. AFOSR F49620-98-1-0400, the National Science Foundation through Grant No. DMS-9973203, the Fonds National de la Recherche Scientifique (Belgium), and the InterUniversity Attraction Pole of the Belgian government. The research of M.N. was supported by the Fonds National de la Recherche Scientifique (Belgium). The research of T.B.S. was supported in part by the U.S. Army Research Office under Contract No. DAAG-55-98-C-0038, and by the U.S. Air Force Research Laboratory under Contract No. F29601-00-C-0001. | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | American Physical Society | en_US |
| dc.relation.ispartofseries | vol. 65 | en_US |
| dc.relation.ispartofseries | no. 5 | en_US |
| dc.title | Bistability of pulsating intensities for double-locked laser diodes | en_US |
| dc.type | Article | en_US |
| dc.identifier.url | http://dx.doi.org/10.1103/PhysRevE.65.056610 | |
