Browsing School of Design (CIAS)--ETDs by Author "Huff, Kevin"
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Comparison of the mid-frequency line edge noise algorithms of Jim Hamerly and Yigal Gur for the best correlation to the psychophysical defect known as raggedness
Huff, Kevin (1987-08-12)A study was conducted to compare the mid-frequency line edge noise algorithms of Jim Hamerly and Yigal Gur. Comparisons were made to determine which algorithm correlated best with the psychophysical defect known as ...