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dc.date.accessioned2008-06-19T19:39:34Z
dc.date.available2008-06-19T19:39:34Z
dc.date.issued1999-04-19
dc.identifier.urihttp://hdl.handle.net/1850/6287
dc.descriptionNTID news press release.en_US
dc.description.abstractFor the first time ever, Chinese education leaders, April 19-22, 1999, are visiting the National Technical Institute for the Deaf (NTID) at Rochester Institute of Technology (RIT), to learn and replicate ways to improve education for deaf students.en_US
dc.language.isoen_USen_US
dc.publisherRochester Institute of Technologyen_US
dc.titleChinese visit a first at NTIDen_US
dc.typeArticleen_US


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