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dc.contributor.authorRosario, Hector
dc.contributor.authorSaber, Eli
dc.contributor.authorWu, Wencheng
dc.contributor.authorChandu, Kartheek
dc.date.accessioned2009-04-08T14:52:58Z
dc.date.available2009-04-08T14:52:58Z
dc.date.issued2007-12-06
dc.identifier.citationJournal of Electronic Imaging 16(4),(Oct–Dec 2007)
dc.identifier.issn1017-9909
dc.identifier.urihttp://hdl.handle.net/1850/8923
dc.descriptionRIT community members may access full-text via RIT Libraries licensed databases: http://library.rit.edu/databases/
dc.description.abstractWe describe a method for automatically detecting streaks in printed images using adaptive window-based image projections and mutual information. The proposed approach accepts a scanned image enclosing the defect and computes the projections across the entire image at different window sizes. The resulting traces collected from the projections are analyzed with a peak detection algorithm and subsequently correlated using normalized mutual information to pinpoint the location and width of streak(s). Finally, for a given peak, the window size is changed adaptively to identify and locate the intensity and length of the corresponding streak(s) while maximizing the signal-to-noise ratio. Results on synthetic and real-life images are provided to demonstrate the effectiveness of our proposed technique.en_US
dc.language.isoen_USen_US
dc.publisherSPIEen_US
dc.relation.ispartofseriesVol. 16en_US
dc.relation.ispartofseriesNo. 4en_US
dc.subjectAdaptive image proessingen_US
dc.subjectPeak detection algorithmen_US
dc.subjectPrinted imagesen_US
dc.subjectStreaksen_US
dc.titleStreak detection in mottled and noisy imagesen_US
dc.typeArticleen_US
dc.identifier.urlhttp://dx.doi.org/10.1117/1.2816444


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