RIT Digital Archive

Browsing Office of the President (RIT) by Author "Antonsen, Thomas Jr"

RIT Digital Archive

Browsing Office of the President (RIT) by Author "Antonsen, Thomas Jr"

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  • Abe, David; Carmel, Yuval; Miller, Susanne; Bromborsky, Alan; Levush, Baruch; Antonsen, Thomas Jr; Destler, William (Institute of Electrical and Electronics Engineers, 1998-06)
    Internal field-emission breakdown in the electrodynamic structures of high-power microwave (HPM) devices can seriously limit the device’s output power and pulse duration. Increasing the diameter of the electrodynamic ...

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