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Reporter

dc.contributor.authorVenditti, Anthony
dc.contributor.authorBaynes, Janeen
dc.contributor.authorParuchuri, Harsha
dc.contributor.authorLeshinski, Kim
dc.contributor.authorMulligan, Beth
dc.contributor.authorVondrak, Otto
dc.contributor.authorCaton, Jon-Claude
dc.contributor.authorWong, Jeff
dc.contributor.authorHusain, Tariq
dc.contributor.authorTipton, Jenn
dc.contributor.authorPfueller, Ed
dc.contributor.authorPugliese, Rudy
dc.contributor.authorGreenizen, Kristine
dc.contributor.authorLane, Crystal
dc.contributor.authorWake, Kevin
dc.contributor.authorGillespie, Richard
dc.contributor.authorWaltz, Brian
dc.contributor.authorKendig, Shawn
dc.contributor.authorFagans, Michael
dc.contributor.authorNewland, Dan
dc.contributor.authorDaley, Alexandra
dc.contributor.authorBadera, Andrew
dc.contributor.authorSpittal, Nick
dc.contributor.authorOak, Leslie
dc.contributor.authorBenenati, Greg
dc.contributor.authorHuber, William
dc.contributor.authorKaylani, Zane
dc.contributor.authorLong, Alex
dc.contributor.authorLukow, Pete
dc.contributor.authorGrocki, Chris
dc.contributor.authorFleming, Brett
dc.contributor.authorCostantini, Jon
dc.contributor.authorPrystajko, Jeff
dc.contributor.authorTaylor, Jenn
dc.contributor.authorGingrich, Josh
dc.contributor.authorMoon, Brian
dc.contributor.authorPacchiarotti, Jason
dc.contributor.authorD'Amato, Christine
dc.contributor.authorKuntze, Davin
dc.contributor.authorGombert, Andrew
dc.contributor.authorGolden, John
dc.contributor.authorRackoff, Adam
dc.contributor.authorWolfe, Jason
dc.contributor.authorCaruso, Christopher
dc.contributor.authorWiley, Eric
dc.contributor.authorCurran, Chris
dc.contributor.authorHazelwood, Dave
dc.contributor.authorHesler, Bret
dc.date1999
dc.date.accessioned2016-03-21T15:35:09Z
dc.date.available2016-03-21T15:35:09Z
dc.date.issued1999-02-12
dc.identifier.urihttp://hdl.handle.net/1850/18472
dc.descriptionIssue Subtitled: EXAMSen_US
dc.language.isoen_USen_US
dc.publisherRochester Institute of Technologyen_US
dc.titleReporteren_US
dc.typeMagazineen_US


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