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dc.contributor.authorKandlikar, Satish
dc.contributor.authorHabsberg, Sandor
dc.date.accessioned2008-12-01T20:10:02Z
dc.date.available2008-12-01T20:10:02Z
dc.date.issued1989-12
dc.identifier.urihttp://hdl.handle.net/1850/7572
dc.descriptionProceedings from the ASME annual winter meeting, December 1989. Please go to www.ASME.org for the complete proceedings.en_US
dc.descriptionRIT community members may access full-text via RIT Libraries licensed databases: http://library.rit.edu/databases/
dc.description.abstractA literature review on the recent applications and developments of thermosiphon loop is conducted. In particular, systems suitable for cooling of microelectronic chips are reviewed in greater detail. The advantages of using a thermosiphon loop in microelectronic applications are discussed. The instability and temperature overshoot at the start-up have been identified as major problems which require further investigation. An experimental thermosiphon loop facility is built for preliminary investigations. Qualitative results on instability and temperature overshoot are obtained by varying the time interval between shutdown and next start-up. For the conditions of the tests conducted, aging did not affect the results, but the liquid subcooling and the dissolved gases are suspected to play an important role in the start-up behavior.en_US
dc.language.isoen_USen_US
dc.publisherAmerican Society of Mechanical Engineers (ASME)en_US
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dc.titleInstabilities in an R-11 thermosiphon loop with applications in microelectronic chip coolingen_US
dc.typeProceedingsen_US


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